The Lehigh Microscopy School (LMS) welcomed 67 participants hailing from the United States, Canada, Japan, and Brazil for a week of microscopy education.
Attendees took part in an intensive course during the school’s 51st session (June 3-7, 2024), gaining in-depth experience of state-of-the-art Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB), and Transmission Electron Microscopy (TEM) techniques, as well as introductory SEM techniques for new learners.
LMS provides a unique platform for participants to learn from leading experts in the field. The school is renowned for its comprehensive curriculum and high level of interaction between students and instructors. Participants had the opportunity to engage with advanced microscopy equipment from industry-leading manufacturers.
LMS Director Christopher J. Kiely, Harold B. Chambers Senior Professor of Materials Science and Engineering at Lehigh University, emphasizes the school's commitment to advancing microscopy knowledge and fostering international collaboration. "Our goal is to equip scientists and engineers with the skills they need to push the boundaries of materials science and other fields," says Kiely. "The diverse backgrounds and perspectives of our participants enrich the learning experience for everyone involved."
The 2024 session upheld LMS's long-standing reputation for excellence, ensuring that attendees “left with enhanced skills and a deeper understanding of modern microscopy,” says LMS Co-Director Masashi Watanabe, a professor of materials science and engineering. As the Lehigh Microscopy School continues to evolve, he says, “it remains a vital resource for professionals seeking to advance their expertise in this critical area of scientific research.”
The Lehigh Microscopy School is offered in conjunction with Lehigh’s Institute for Functional Materials and Devices (I-FMD). For more information, visit the LMS website and follow on LinkedIn.
