Student: Muqing Zheng
Project: Characterizing and Filtering Out Device Noise for Quantum Optimization Algorithms
View: Research Poster (PDF) | Presentation (YouTube)
Department: Industrial and Systems Engineering
Advisor: Xiu Yang
Abstract
Various noise models have been developed in quantum computing study to describe the propagation and effect of the noise which is caused by imperfect implementation of hardware. Identifying parameters such as gate and readout error rates are critical to these models. We use a Bayesian approach to infer posterior distributions of these parameters, such that they can be characterized more elaborately. By characterizing the device errors in this way, we can further improve the accuracy of quantum error mitigation. Experiments conducted on IBM's quantum computing devices suggest that our approach provides better error mitigation performance than existing techniques, in which error rates are estimated as deterministic values. Also, our approach outperforms the standard Bayesian inference method in such experiments. More importantly, our approach only requires data from constant number of circuits.
About Muqing Zheng
Muqing Zheng is a second-year Ph.D. student in the Industrial and Systems Engineering Department at Lehigh University. He received his Bachelor of Science degree in mathematics from Rose-Hulman Institute of Technology in Indiana. Currently, he is working with Professor Xiu Yang on quantum error mitigation.