In sight: A paradigm shift in materials characterization
Materials science researchers are developing novel instrumentation that could outperform synchrotron-based x-ray absorption spectrometry in giving scientists a clearer picture of elemental composition and chemical bonding at the nanoscale level
Lehigh University researchers are transforming an aberration-corrected scanning transmission electron microscope (STEM) into the equivalent of a synchrotron facility (a football-field-size particle accelerator), with greatly improved spatial resolution and versatility.